Name: Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat (en Inglés)
Price: 1134.87 MXN
Availability: InStock
Author: Rajput, Rahul Singh
ISBN: 9786200092076

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portada Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat (en Inglés)

Formato

Libro Físico

Autor

Rahul Singh Rajput

Editorial

LAP Lambert Academic Publishing

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

Dimensiones

22.9 x 15.2 x 0.4 cm

Peso

0.10 kg.

ISBN13

9786200092076

Categorías

Genética (no médica)

Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat (en Inglés)

Rahul Singh Rajput (Autor) · LAP Lambert Academic Publishing · Tapa Blanda

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat (en Inglés)"

The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.